RF impedance/material analyzer, Agilent E4991A

RF impedance/material analyzer

This part is an Agilent  E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function todesigners who evaluate components and circuits in the range of 3 GHz. The E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.

Measurement parameters: |Z|, |Y|, Ls, Lp, Cs, Cp, Rs(R), Rp, X, G, B, D, Q, θz, θy, |Γ|, Γx, Γy, θγ

Permittivity parameters: |εr|, εr’, εr”, tanδ

Permeability parameters: |μr|, μr’, μr”, tanδ

The following are application examples:

  • RF impedance measurement of chip components such as ceramic capacitors, RF inductors, ferrite beads, and resistorsSemiconductors
  • Capacitance-Voltage (C-V) characteristics and Equivalent Series Resistance (ESR) measurements of varactordiodesMaterials
  • Permittivity and loss tangent evaluation of plastics, ceramics, printed circuit boards and other dielectric material
  • Permeability and loss tangent evaluation of ferrite, amorphous and other magnetic materials


Semiconductor Device Parameter Analyzer (left)- RF impedance/material analyzer (right)